NenoVision Applications

APPLICATIONS - THE NEXT LEVEL OF CORRELATIVE MICROSCOPY

The AFM-in-SEM approach merges Atomic Force Microscopy and Scanning Electron Microscopy into one tool that combines the capabilities of both techniques. Additionally, NenoVision‘s cutting-edge correlative imaging of AFM and SEM data sets the product apart from the competition, making NenoVision’s unique Atomic Force Microscope, LiteScope™, the most advanced AFM in SEM on the market.

Refer:  https://www.nenovision.com/applications/