Welcome to the world of cutting edge technology. We bring to you systems that enhance your research capabilities or improve your quality control regimen through some exciting products.
From high sensitivity to ultimate reliability our instruments will help you to conduct your experiments with confidence and ready-to publish data.
From cells to catalysts to metals, we cover the entire gamut of sample types with instruments for analysis of soft or biological samples to hardest metals.
Observe your samples at atomic resolution under various test conditions. In-situ TEM products and mechanical testers will help you resolve nano to macro.
Nanotalks brings the TEM community to the comfort of your personal computer with researchers and industry experts presenting their most recent work and techniques. To learn from some of the best or network with researchers in your field, Nanotalks shares the latest in-situ knowledge to build a global community of in-situ TEM researchers.
Are you looking for solutions to some mechanical testing issues? A good way to discover how Biomomentum could help you is to browse through our solutions section; Each tab (Materials, Test Configurations and Case Studies) describes what type of solutions we could offer you.
Our products are fully compatible with all brands of electron microscopes and cover the entire range of the thinning process from the mechanical sample preparation to ion milling and polishing. The applications are suitable for material science, biological research, geology, semiconductor, optical industry and many others.
The AFM-in-SEM approach merges Atomic Force Microscopy and Scanning Electron Microscopy into one tool that combines the capabilities of both techniques. Additionally, NenoVision‘s cutting-edge correlative imaging of AFM and SEM data sets the product apart from the competition, making NenoVision’s unique Atomic Force Microscope, LiteScope™, the most advanced AFM in SEM on the market.
More than 30 different measuring techniques covering all types of physical and mechanical property measurements at the submicron and nanometer scale.